Thermal noise in contact atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Noise reduction in atomic force microscopy: Resonance contact mode
Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. We call ...
متن کاملFinite Element Simulation of Contact Mechanics of Cancer Cells in Manipulation Based on Atomic Force Microscopy
The theory of contact mechanics deals with stresses and deformations which arise when the surfaces of two solid bodies are brought into contact. In elastic deformation contact occurs over a finite area. A regular method for determining the dimensions of this area is Hertz Contact Model. Appearance of atomic force microscope results in introduction of Contact ...
متن کاملEffective Parameters in Contact Mechanic for Micro/nano Particle Manipulation Based on Atomic Force Microscopy
The effect of geometry and material of the Micro/Nano particle on contact mechanic for manipulation was studied in this work based on atomic force microscopy. Hertz contact model simulation for EpH biological micro particle with spherical, cylindrical, and circular crowned roller shape was used to investigate the effect of geometry on contact simulation process in manipulation. Then, to val...
متن کاملCan atomic force microscopy achieve atomic resolution in contact mode?
Atomic force microscopy operating in the contact mode is studied using total-energy pseudopotential calculations. It is shown that, in the case of a diamond tip and a diamond surface, it is possible for a tip terminated by a single atom to sustain forces in excess of 30 nN. It is also shown that imaging at atomic resolution may be limited by blunting of the tip during lateral scanning.
متن کاملContact-resonance atomic force microscopy for viscoelasticity
We present a quantitative method for determining the viscoelastic properties of materials with nanometer spatial resolution. The approach is based on the atomic force acoustic microscopy technique that involves the resonant frequencies of the atomic force microscopy cantilever when its tip is in contact with a sample surface. We derive expressions for the viscoelastic properties of the sample i...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2021
ISSN: 0021-8979,1089-7550
DOI: 10.1063/5.0054256